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An electron microscope, when equipped with a Backscattered Electron Detector, has the capacity to produce images in which contrast is controlled by the differences in atomic numbers (Z) across the specimen. We currently have four reference specimens which are available for testing the atomic number contrast performance of backscattered electron detection systems.
Each of the reference specimens consists of two high purity elements that have an atomic number difference of 1. They are embedded side by side in a contrasting matrix and are available as a single mount or can be incorporated into a block of standards.
Duplex Brass
This standard allows checking the resolution and performance of the Backscattered Electron Detector. The resolution of a detector is usually quoted as 0.1 (Z) where the atomic number (Z) = 30. This is obtained in our standard by the mean atomic number between the phases of α/β Brass, being 0.1Z.
Phases of Duplex Brass:
Darker Phase Z = 29.37
Lighter Phase Z = 29.47
Phases of Duplex Brass:
Darker Phase Z = 29.37
Lighter Phase Z = 29.47
