Quartz
SiO2
wdx 
edx
thin film 
thin foil
xrf
edx
thin film
thin foil
xrf
Location
Rhone Valley, France
Dana Class
75.01.03.01
Strunz Class
04.DA.05
| Element | WT% |
| Si | 52.09% |
| O | 47.91% |
| Compound | WT% |
