Forsterite
Mg2SiO4
wdx 
edx
thin film
thin foil 
xrf
edx
thin film
thin foil
xrf
Location
Pamir, USSR
Dana Class
51.03.01.02
Strunz Class
09.AC.05
| Element | WT% |
| Si | 18.88% |
| Mg | 35.96% |
| O | 45.16% |
| Compound | WT% |
| SiO2 | 40.38% |
| MgO | 59.62% |
